Influence of magnetic domain walls on all-optical magnetic toggle switching in a ferrimagnetic GdFe film

• Rahil Hosseinifar,
• Evangelos Golias,
• Ivar Kumberg,
• Quentin Guillet,
• Karl Frischmuth,
• Sangeeta Thakur,
• Mario Fix,
• Manfred Albrecht,
• Florian Kronast and
• Wolfgang Kuch

Beilstein J. Nanotechnol. 2022, 13, 74–81, doi:10.3762/bjnano.13.5

• deterministic toggle switching. Keywords: all-optical magnetic switching; GdFe; laser-induced domain-wall motion; magnetic domain imaging; photoemission electron microscopy; Introduction The reversal of magnetization at the fastest possible time scales and microscopic length scales is one of the most

• individual ultrashort focused laser pulses has been reported [21]. In this paper, we investigate nondeterministic all-optical toggle switching of a Gd26Fe74 film with out-of-plane easy axis of magnetization by magnetic imaging using photoemission electron microscopy (PEEM) with X-ray magnetic circular

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• ) eV, which is almost 1 eV lower than previous X-ray photoemission electron microscopy (XPEEM) and UPS studies (4.13 and 4.2 eV) for untreated oxide [32][33]. As stated before, KPFM investigations reveal certain variations in the work function value of TiO nanostructures. To illustrate this properly a

Optical near-field mapping of plasmonic nanostructures prepared by nanosphere lithography

• Gitanjali Kolhatkar,
• Alexandre Merlen,
• Jiawei Zhang,
• Chahinez Dab,
• Gregory Q. Wallace,
• François Lagugné-Labarthet and
• Andreas Ruediger

Beilstein J. Nanotechnol. 2018, 9, 1536–1543, doi:10.3762/bjnano.9.144

• techniques lead to sample contamination due to the use of a molecular marker. Other techniques based on electron–sample interactions can be utilized to non-destructively map the distribution of the localized plasmon modes. In photoemission electron microscopy (PEEM), the sample is irradiated with a

Magnetic switching of nanoscale antidot lattices

• Ulf Wiedwald,
• Joachim Gräfe,
• Kristof M. Lebecki,
• Maxim Skripnik,
• Felix Haering,
• Gisela Schütz,
• Paul Ziemann,
• Eberhard Goering and
• Ulrich Nowak

Beilstein J. Nanotechnol. 2016, 7, 733–750, doi:10.3762/bjnano.7.65

• nanostructures. Hence, it is necessary to use complex and sophisticated synchrotron methods like STXM and photoemission electron microscopy (PEEM) or magnetic force microscopy. One possible way, however, gaining further microscopic understanding of interaction phenomena and coercive field distributions in

Cathode lens spectromicroscopy: methodology and applications

• T. O. Menteş,
• G. Zamborlini,
• A. Sala and
• A. Locatelli

Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198

• and combine chemical characterization with X-ray magnetic circular dichroism–photoemission electron microscopy (XMCD–PEEM) magnetic imaging by using the variable photon polarization and energy available at the synchrotron source. Keywords: gold (Au); graphene; intercalation; low-energy electron

• microscopy (LEEM); magnetism; nanostructures; X-ray magnetic circular dichroism (XMCD); X-ray photoemission electron microscopy (XPEEM); Introduction The cathode lens, or immersion objective lens, is used to image electrons emitted from surfaces [1]. In a microscope that uses this type of objective, the

• emission, emission of photoelectrons from core levels and the valence band or elastic backscattering [2]. Methods based on the latter two, photoemission electron microscopy (PEEM) and low energy electron microscopy (LEEM), have found a special place in the field of surface science, and they will be the

Mapping of plasmonic resonances in nanotriangles

• Simon Dickreuter,
• Julia Gleixner,
• Andreas Kolloch,
• Johannes Boneberg,
• Elke Scheer and
• Paul Leiderer

Beilstein J. Nanotechnol. 2013, 4, 588–602, doi:10.3762/bjnano.4.66

• the near field of a sample, which is illuminated conventionally [8][9][10]. A related approach is to use a very fine metal or dielectrical tip as a scatterer in the vicinity of the optical near field of the sample [11][12][13]. Another method for mapping near fields is photoemission electron

• microscopy (PEEM), in which photoelectrons emitted from the plasmonic structure out of regions of high field enhancement are imaged in an electron microscope [14][15]. Roughly a decade ago, several techniques with ex-situ analysis have been developed, which can be considered as types of “near-field

Preparation, properties and applications of magnetic nanoparticles

• Ulf Wiedwald and
• Paul Ziemann

Beilstein J. Nanotechnol. 2010, 1, 21–23, doi:10.3762/bjnano.1.4

• Photoemission Electron Microscopy with element-specific magnetic contrast (X-PEEM) [9]. Thus, at the moment one mostly has to rely on ensemble averages and, consequently, this again poses strong requirements on preparation with respect to narrow distributions whenever size dependent properties play a role. This